Now reliably pinpoint bad capacitors and inductors in-circuit, or completely analyze them out-of-circuit with exclusive, dynamic, automatic tests to EIA standard

• Automatically tells you when further out-of-circuit tests are required.
• Tests SMT components "in-circuit" and accurately with exclusive, time-saving test accessories
• Makes all tests, compares the results to EIA standards, and tells you "GOOD" or "BAD" - automatically
• Analyzes capacitors for all four failures out-of-circuit:
     -Value from 1pF to 20 F
     -Equivalent series resistance
     -Leakage with up to 1,000 volts applied
     -Dielectric absorption
• Analyzes inductors with exclusive patented tests for:
     -Values from 0.1 uH to 20 H
     -Opens for shorts
     -Even one shorted turn with patented "Ringer" test
• Tests SCRs and triacs with optional SCR250 accessory

LC103 Condensed Specifications

IN-CIRUIT TESTS (Capacitors and Inductors)

• Dynamic in-circuit tests to determine whether the component is good or bad.
• Component types: Electrolytic, double layer lytic, tantalum, ceramic, and other capacitors.
• Yokes, flybacks, switching transformers, and coils.
• Inductor Range: 3.18 uH to 3.18 H
• Capacitor Range: 0.002 uF to 20,000 uF
• Accuracy: Same as Out-of-Circuit tests for known good inductors and capacitors with no parallel current paths.
• Suggest Removal Indication: Initiated when AC test differs from DC test by more than 20%, or if low level DCR test indicates a leakage path greater than 20% of charge current for capacitors.